Proceedings of the 37th Annual Conference on Deep Foundations, 2012, Houston, TX, USA, (DFI)
Pile Settlement Design Using Continuous Surface Wave Testing and Modulus Degradation
Hennie F. T. Barnard, Theodore E. B. Vorster
Where geotechnical designs are governed by settlement requirements, soil and rock moduli are important parameters for design. This paper reports on a method that was used to utilize dynamic modulus measurements in the field toward pile settlement designs for the proposed Square Kilometer Array (SKA) Project to be located near Carnarvon, South Africa. The project will comprise of over 3000 No. movement sensitive satellite dish structures. The method described in the paper utilizes strain-related modulus degradation across the complete ground profile, starting from measurements of peak particle velocity (and inference to dynamic modulus at small strain) as measured using Continuous Surface Wave (CSW) testing at individual dish positions. This is required due to the very small allowable foundation rotation of 5 arc seconds under the dishes’ operational conditions. The strategy of analysis was to conduct an iterative process starting from the measured small strain modulus profile of the ground. The likely maximum pile force for a specific piled foundation option was estimated and a single pile finite element analysis was performed using Plaxis 2D (Version 2010) to estimate the expected ground strain developing along the length of the pile. By assuming the shape of the shear modulus degradation curve with increasing shear strain, the iteration process then converged on a likely degraded modulus profile associated with the single pile and maximum load assumed. This process enabled identifying the pile cap size, pile configuration, pile sizes and pile lengths that would meet the operational movement limits. The chosen pile group configuration was then analyzed using the Repute 1.5 pile group analysis software. The design process and typical results are discussed in this paper.
|article #1845; publication #99 (AM-2012)|